02017cam a2200253 i 45000010006000000050017000060080041000230200029000640200026000930500023001191000026001422450146001682600063003143000019003774900054003965040050004505050207005005200877007076500027015846500032016116500044016436500052016877000024017393235620230531230928.0140910s2013    enk      b    001 0 eng    a9781107004610 (hardback)  a1107004616 (hardback)00aTK7876b.C397 20131 aCarvalho, Nuno Borges10aMicrowave and wireless measurement techniques /cNuno Borges Carvalho, Universidade de Aveiro, Dominique Schreurs, KU Leuven, Belgiumh[book] 1aNew York :aNew York :bCambridge University Press,c2013.  axiv, 220 pages0 aThe Cambridge RF and microwave engineering series  aIncludes bibliographical references and index8 aMachine generated contents note: 1. Measurement of wireless transceivers; 2. Instrumentation for wireless systems; 3. Signal excitation; 4. Test benches for wireless system characterization and modeling  a"From typical metrology parameters for common wireless and microwave components to the implementation of measurement benches, this introduction to metrology contains all the key information on the subject. Using it, readers will be able to: Interpret and measure most of the parameters described in a microwave component's datasheet Understand the practical limitations and theoretical principles of instrument operation Combine several instruments into measurement benches for measuring microwave and wireless quantities. Several practical examples are included, demonstrating how to measure intermodulation distortion, error vector magnitude, S-parameters and large signal waveforms. Each chapter then ends with a set of exercises, allowing readers to test their understanding of the material covered and making the book equally suited for course use and for self-study" 0aMicrowave measurements 0aMicrowave circuitsxTesting 0aWireless communication systemsxTesting 7aTECHNOLOGY & ENGINEERING / Microwaves.2bisacsh1 aSchreurs, Dominique